Indexed in Journament

2017 IEEE International Electron Devices Meeting (IEDM)

EN

Certificate of Indexing
Login or register to claim ownership or editorship of this journal.
1
Articles Indexed

About This Journal

Short Name 2017 IEEE International Electron Devices Meeting (IEDM)
Abbreviated Name 2017 IEEE International Electron Devices Meeting (IEDM)

Tools & Certificate of Indexing

Certificate of Indexing

Publications Per Year

Articles (1)

2017
Smart GaN platform: Performance & challenges
Chun-Lin Tsai,Yun-Hsiang Wang,M.-H. Kwan,P.-C. Chen,F.-W. Yao,S.-C. Liu,J.-L. Yu,C.-L. Yeh,R.-Y. Su,W. Wang,W.-C. Yang,K.-Y. Wong,Y.-S. Lin,M.-C. Lin,H.-Y. Wu,C.-M. Chen,C.-Y. Yu,C.-B. Wu,M.-H. Chang,J.-S. You,T.-M. Huang,S.-P. Wang,L. Y. Tsai,Chan-Hong Chern,H. C. Tuan,Alex Kalnitsky;Chun-Lin Tsai;Yun-Hsiang Wang;M.-H. Kwan;P.-C. Chen;F.-W. Yao;S.-C. Liu;J.-L. Yu;C.-L. Yeh;R.-Y. Su;W. Wang;W.-C. Yang;K.-Y. Wong;Y.-S. Lin;M.-C. Lin;H.-Y. Wu;C.-M. Chen;C.-Y. Yu;C.-B. Wu;M.-H. Chang;J.-S. You;T.-M. Huang;S.-P. Wang;L. Y. Tsai;Chan-Hong Chern;H. C. Tuan;Alex Kalnitsky;
, pp. 33.1.1-33.1.4
200 views DOI Abstract
2017
Smart GaN platform: Performance & challenges
Chun-Lin Tsai,Yun-Hsiang Wang,M.-H. Kwan,P.-C. Chen,F.-W. Yao,S.-C. Liu,J.-L. Yu,C.-L. Yeh,R.-Y. Su,W. Wang,W.-C. Yang,K.-Y. Wong,Y.-S. Lin,M.-C. Lin,H.-Y. Wu,C.-M. Chen,C.-Y. Yu,C.-B. Wu,M.-H. Chang,J.-S. You,T.-M. Huang,S.-P. Wang,L. Y. Tsai,Chan-Hong Chern,H. C. Tuan,Alex Kalnitsky;Chun-Lin Tsai;Yun-Hsiang Wang;M.-H. Kwan;P.-C. Chen;F.-W. Yao;S.-C. Liu;J.-L. Yu;C.-L. Yeh;R.-Y. Su;W. Wang;W.-C. Yang;K.-Y. Wong;Y.-S. Lin;M.-C. Lin;H.-Y. Wu;C.-M. Chen;C.-Y. Yu;C.-B. Wu;M.-H. Chang;J.-S. You;T.-M. Huang;S.-P. Wang;L. Y. Tsai;Chan-Hong Chern;H. C. Tuan;Alex Kalnitsky;
, pp. 33.1.1-33.1.4
200 views DOI Abstract
0
Overall
Not Rated
0
0
0
0
0
0
0
0
0
0
0
Journament