Indexed in Journament

proceedings, annual meeting, electron microscopy society of america

EN

Certificate of Indexing
Login or register to claim ownership or editorship of this journal.
4
Articles Indexed

About This Journal

Short Name proceedings, annual meeting, electron microscopy society of america
Abbreviated Name proceedings, annual meeting, electron microscopy society of america

Tools & Certificate of Indexing

Certificate of Indexing

Publications Per Year

Articles (4)

1991
Combining slow-scan CCD images to extend image size and dynamic range
G.Y. Fan,A.J. Gubbens,O.L. Krivanek,M.L. Leber,P.E. Mooney;G.Y. Fan;A.J. Gubbens;O.L. Krivanek;M.L. Leber;P.E. Mooney;
Vol. 49 , pp. 524-525
253 views DOI
1993
Data acquisition and processing for automated electron microscopy
O.L. Krivanek,W.J. De Ruijter,C.E. Meyer,M.L. Leber,J. Wilbrink;O.L. Krivanek;W.J. De Ruijter;C.E. Meyer;M.L. Leber;J. Wilbrink;
Vol. 51 , pp. 546-547
242 views DOI
1990
Advances in Parallel-Detection EELS
O.L. Krivanek,N. Dellby,A.J. Gubbens,M.K. Kundmann,M.L. Leber,D.A. Ray,K.V. Truong;O.L. Krivanek;N. Dellby;A.J. Gubbens;M.K. Kundmann;M.L. Leber;D.A. Ray;K.V. Truong;
Vol. 48 , No. 2 , pp. 76-77
227 views DOI
1993
Three-fold astigmatism: An important TEM aberration
O.L. Krivanek,M.L. Leber;O.L. Krivanek;M.L. Leber;
Vol. 51 , pp. 972-973
223 views DOI
1993
Three-fold astigmatism: An important TEM aberration
O.L. Krivanek,M.L. Leber;O.L. Krivanek;M.L. Leber;
Vol. 51 , pp. 972-973
223 views DOI
1993
Data acquisition and processing for automated electron microscopy
O.L. Krivanek,W.J. De Ruijter,C.E. Meyer,M.L. Leber,J. Wilbrink;O.L. Krivanek;W.J. De Ruijter;C.E. Meyer;M.L. Leber;J. Wilbrink;
Vol. 51 , pp. 546-547
242 views DOI
1991
Combining slow-scan CCD images to extend image size and dynamic range
G.Y. Fan,A.J. Gubbens,O.L. Krivanek,M.L. Leber,P.E. Mooney;G.Y. Fan;A.J. Gubbens;O.L. Krivanek;M.L. Leber;P.E. Mooney;
Vol. 49 , pp. 524-525
253 views DOI
1990
Advances in Parallel-Detection EELS
O.L. Krivanek,N. Dellby,A.J. Gubbens,M.K. Kundmann,M.L. Leber,D.A. Ray,K.V. Truong;O.L. Krivanek;N. Dellby;A.J. Gubbens;M.K. Kundmann;M.L. Leber;D.A. Ray;K.V. Truong;
Vol. 48 , No. 2 , pp. 76-77
227 views DOI
0
Overall
Not Rated
0
0
0
0
0
0
0
0
0
0
0
Journament