Advances in Parallel-Detection EELS
Clicks: 263
ID: 118893
1990
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| Reference Key |
truong1990proceedings,advances
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| Authors | O.L. Krivanek,N. Dellby,A.J. Gubbens,M.K. Kundmann,M.L. Leber,D.A. Ray,K.V. Truong;O.L. Krivanek;N. Dellby;A.J. Gubbens;M.K. Kundmann;M.L. Leber;D.A. Ray;K.V. Truong; |
| Journal | proceedings, annual meeting, electron microscopy society of america |
| Year | 1990 |
| DOI |
10.1017/s0424820100133977
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| URL | |
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