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ieee transactions on applied superconductivity

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scopus
Short Name ieee transactions on applied superconductivity
Abbreviated Name ieee transactions on applied superconductivity
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Recent Articles (14 total)

1995
Effect on c-axis transport properties of a critical state in Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/ single crystals
J.H. Cho,M.P. Maley,L.N. Bulaevskii;J.H. Cho;M.P. Maley;L.N. Bulaevskii;
Vol. 5 , No. 2 , pp. 1880-1883
269 views DOI
2019
Conceptual Development of a Novel Ultra-Thin and Transparent 2 T Superconducting Detector Solenoid for the Future Circular Collider
Kulenkampff, T.
Vol. 29 , pp. 0-0
251 views DOI
2019
Protocol of Measuring Hot-Spot Correlation Length for SNSPDs with Near-Unity Detection Efficiency
Polyakova, M.
Vol. 29 , pp. 0-0
212 views DOI
2020
Quench-Back Management for Fast Decaying Currents in SHMS Superconducting Magnets at Jefferson Lab
Sun, E.
Vol. 30 , pp. 0-0
201 views DOI
2019
Modelling a Transition-Edge Sensor X-Ray Microcalorimeter Linear Array for Compton Profile Measurements and Energy Dispersive Diffraction
Yan, D.
Vol. 29 , pp. 0-0
176 views DOI
1999
Single and multi-phase AC losses in HTS prototype power transmission conductors
J.O. Willis,D.E. Daney,M.P. Maley,J.Y. Coulter,S. Fleshler;J.O. Willis;D.E. Daney;M.P. Maley;J.Y. Coulter;S. Fleshler;
Vol. 9 , No. 2 , pp. 778-781
168 views DOI
2000
Interstrand contact resistance and AC loss of a 48-strands Nb/sub 3/Sn CIC conductor with a Cr/Cr-oxide coating
A. Nijhuis,H.H.J. Ten Kate,V. Pantsyrny,M. Santini;A. Nijhuis;H.H.J. Ten Kate;V. Pantsyrny;M. Santini;
Vol. 10 , No. 1 , pp. 1090-1093
167 views DOI Abstract
2019
Bit-Slice Butterfly Processing Units for 64-point RSFQ FFT Processors
Tang, G.M.
, pp. 0-0
126 views DOI
2020
Microstructure and Mechanical Properties of the Enclosure Welding Joint for ITER Correction Coils Cases
Xin, J.
Vol. 30 , pp. 0-0
122 views DOI
2015
High-speed operation of an SFQ butterfly processing circuit for FFT processors using the 10 kA/cm<sup>2</sup> Nb process
Sakashita, Y.
Vol. 25 , pp. 0-0
111 views DOI
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