ti-doped zno thin films prepared at different ambient conditions: electronic structures and magnetic properties
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2010
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Abstract
We present a comprehensive study on Ti-doped ZnO thin films using X-ray Absorption Fine Structure (XAFS) spectroscopy. Ti K edge XAFS spectra were measured to study the electronic and chemical properties of Ti ions in the thin films grown under different ambient atmospheres. A strong dependence of Ti speciation, composition, and local structures upon the ambient conditions was observed. The XAFS results suggest a major tetrahedral coordination and a 4+ valence state. The sample grown in a mixture of 80% Ar and 20% O2 shows a portion of precipitates with higher coordination. A large distortion was observed by the Ti substitution in the ZnO lattice. Interestingly, the film prepared in 80% Ar, 20% O2 shows the largest saturation magnetic moment of 0.827 ± 0.013 µB/Ti.
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| Authors | ;Zhihua Yong;Tao Liu;Tomoya Uruga;Hajime Tanida;Dongchen Qi;Andrivo Rusydi;Andrew T. S. Wee |
| Journal | Nature Materials |
| Year | 2010 |
| DOI |
10.3390/ma3063642
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