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Advances in Parallel-Detection EELS
O.L. Krivanek,N. Dellby,A.J. Gubbens,M.K. Kundmann,M.L. Leber,D.A. Ray,K.V. Truong;O.L. Krivanek;N....
1990 proceedings, annual meeting, electron microscopy s... DOI: 10.1017/s04248201001... 161 views

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