copper-filled structure

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Thermal Analysis and Operational Characteristics of an AlGaN/GaN High Electron Mobility Transistor with Copper-Filled Structures: A Simulation Study.

Jang, Kyu-Won;Hwang, In-Tae;Kim, Hyun-Jung;Lee, Sang-Heung;Lim, Jong-Won;Kim, Hyun-Seok;

2019 micromachines DOI: E53 193 views

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micromachines

ISSN: 2072-666X 942 views

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thermal conductivity gan high electron mobility transistor self-heating effect