high-temperature electron irradiation

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Irradiation temperature dependence of radiation damage in STI Si diodes

H. Ohyama,K. Hayama,K. Takakura,T. Miura,K. Shigaki,T. Jono,E. Simoen,A. Poyai,C. Claeys;H. Ohyama;K...

2003 microelectronic engineering DOI: 10.1016/s0167-9317(0... 207 views

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sti (shallow trench isolation) diode degradation of performance