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Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
K. Kanisauskas,A. Affolder,K. Arndt,R. Bates,M. Benoit,F. Di Bello,A. Blue,D. Bortoletto,M. Buckland...
2017 journal of instrumentation DOI: 10.1088/1748-0221/12... 185 views

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