Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1
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ID: 269050
2017
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Abstract
CMOS active pixel sensors are being investigated for their potential use in the ATLAS inner tracker upgrade at the HL-LHC. The new inner tracker will have to handle a significant increase in luminosity while maintaining a sufficient signal-to-noise ratio and pulse shaping times. This paper focuses on the prototype chip "HVStripV1" (manufactured in the AMS HV-CMOS 350nm process) characterization before and after irradiation up to fluence levels expected for the strip region in the HL-LHC environment. The results indicate an increase of depletion region after irradiation for the same bias voltage by a factor of ≈2.4 and ≈2.8 for two active pixels on the test chip. There was also a notable increase in noise levels from 85 e− to 386 e− and from 75 e− to 277 e− for the corresponding pixels.
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zhu2017journalradiation
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| Authors | K. Kanisauskas,A. Affolder,K. Arndt,R. Bates,M. Benoit,F. Di Bello,A. Blue,D. Bortoletto,M. Buckland,C. Buttar,P. Caragiulo,D. Das,J. Dopke,A. Dragone,F. Ehrler,V. Fadeyev,Z. Galloway,H. Grabas,I.M. Gregor,P. Grenier,J. Dopke,F. Ehrler,V. Fadeyev,P. Grenier,A. Grillo,B. Hiti,M. Hoeferkamp,L.B.A. Hommels,B.T. Huffman,J. John,C. Kenney,J. Kramberger,Z. Liang,I. Mandic,L.B.A. Hommels,I. Mandic,D. Maneuski,F. Martinez-McKinney,S. MacMahon,L. Meng,M. Mikuž,D. Muenstermann,R. Nickerson,I. Peric,P. Phillips,R. Plackett,M. Mikuž,I. Peric,F. Rubbo,J. Segal,S. Seidel,A. Seiden,I. Shipsey,W. Song,M. Staniztki,D. Su,C. Tamma,R. Turchetta,I. Shipsey,L. Vigani,J. Volk,R. Wang,M. Warren,F. Wilson,S. Worm,Q. Xiu,J. Zhang,H. Zhu;K. Kanisauskas;A. Affolder;K. Arndt;R. Bates;M. Benoit;F. Di Bello;A. Blue;D. Bortoletto;M. Buckland;C. Buttar;P. Caragiulo;D. Das;J. Dopke;A. Dragone;F. Ehrler;V. Fadeyev;Z. Galloway;H. Grabas;I.M. Gregor;P. Grenier;J. Dopke;F. Ehrler;V. Fadeyev;P. Grenier;A. Grillo;B. Hiti;M. Hoeferkamp;L.B.A. Hommels;B.T. Huffman;J. John;C. Kenney;J. Kramberger;Z. Liang;I. Mandic;L.B.A. Hommels;I. Mandic;D. Maneuski;F. Martinez-McKinney;S. MacMahon;L. Meng;M. Mikuž;D. Muenstermann;R. Nickerson;I. Peric;P. Phillips;R. Plackett;M. Mikuž;I. Peric;F. Rubbo;J. Segal;S. Seidel;A. Seiden;I. Shipsey;W. Song;M. Staniztki;D. Su;C. Tamma;R. Turchetta;I. Shipsey;L. Vigani;J. Volk;R. Wang;M. Warren;F. Wilson;S. Worm;Q. Xiu;J. Zhang;H. Zhu; |
| Journal | journal of instrumentation |
| Year | 2017 |
| DOI |
10.1088/1748-0221/12/02/p02010
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| URL | |
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