Carrier profiling with fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InP

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ID: 89389
2019
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dixonluinenburg2019carrierultramicroscopy Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Dixon-Luinenburg, O.
Journal ultramicroscopy
Year 2019
DOI
10.1016/j.ultramic.2019.06.009
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