Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus

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ID: 33202
2012
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Abstract
Bimodal atomic force microscopy is a force-microscopy method that requires the simultaneous excitation of two eigenmodes of the cantilever. This method enables the simultaneous recording of several material properties and, at the same time, it also increases the sensitivity of the microscope. Here we apply fractional calculus to express the frequency shift of the second eigenmode in terms of the fractional derivative of the interaction force. We show that this approximation is valid for situations in which the amplitude of the first mode is larger than the length of scale of the force, corresponding to the most common experimental case. We also show that this approximation is valid for very different types of tip–surface forces such as the Lennard-Jones and Derjaguin–Muller–Toporov forces.
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herruzo2012theoreticalbeilstein Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Herruzo, Elena T.;Garcia, Ricardo;
Journal beilstein journal of nanotechnology
Year 2012
DOI
DOI not found
URL
https://doi.org/10.3762/bjnano.3.22
Keywords Keywords not found

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