Differential phase contrast with a segmented detector in a scanning X-ray microprobe

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ID: 273121
2008
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Abstract
Scanning X-ray microprobes are unique tools for the nanoscale investigation of specimens from the life, environmental, materials and other fields of sciences. Typically they utilize absorption and fluorescence as contrast mechanisms. Phase contrast is a complementary technique that can provide strong contrast with reduced radiation dose for weakly absorbing structures in the multi-keV range. In this paper the development of a segmented charge-integrating silicon detector which provides simultaneous absorption and differential phase contrast is reported. The detector can be used together with a fluorescence detector for the simultaneous acquisition of transmission and fluorescence data. It can be used over a wide range of photon energies, photon rates and exposure times at third-generation synchrotron radiation sources, and is currently operating at two beamlines at the Advanced Photon Source. Images obtained at around 2 keV and 10 keV demonstrate the superiority of phase contrast over absorption for specimens composed of light elements.
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Authors B. Hornberger,M. D. De Jonge,M. Feser,P. Holl,C. Holzner,Chris Jacobsen,D. Legnini,D. Paterson,P. Rehak,L. Strüder,S. Vogt;B. Hornberger;M. D. De Jonge;M. Feser;P. Holl;C. Holzner;Chris Jacobsen;D. Legnini;D. Paterson;P. Rehak;L. Strüder;S. Vogt;
Journal journal of synchrotron radiation
Year 2008
DOI
10.1107/S0909049508008509
URL
https://sciprofiles.com/publication/view/ad92bd60a8d090216c91d8d38fbcb933
Keywords
phase contrast differential phase contrast segmented detector configured detector fluorescence microprobe x-ray microprobe scanning microprobe phase contrast; differential phase contrast; segmented detector; configured detector; fluorescence microprobe; x-ray microprobe; scanning microprobe

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