Formation Mechanism of Secondary Electron Contrast of Graphene Layers on a Metal Substrate.

Clicks: 215
ID: 23768
2017
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Abstract
Scanning electron microscopy (SEM) is widely used to observe graphene on metal substrates. However, the origin of the SEM image contrast of graphene is not well understood. In this work, we performed in situ SEM imaging of layer-number-controlled graphene on a Ni substrate using a high-pass energy filter for secondary electrons. We found that the graphene layer contrast was maximized at 15-20 eV, corresponding to the π-σ* interband transition in graphene. Our results indicate that the SEM image of graphene is produced by attenuation of the electrons emitted from the metal substrate by the monoatomic layers of graphene.
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shihommatsu2017formationacs Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Shihommatsu, Kota;Takahashi, Junro;Momiuchi, Yuta;Hoshi, Yudai;Kato, Hiroki;Homma, Yoshikazu;
Journal ACS omega
Year 2017
DOI
10.1021/acsomega.7b01550
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