numerical simulation of digital vlsi total dose functional failures
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ID: 187042
2016
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Abstract
The technique for numerical simulation of digital VLSI total dose failures is presented, based on fuzzy logic sets theory. It assumes transfer from boolean logic model of a VLSI with values {0,1} to fuzzy model with continuous interval [0,1], and from boolean logic functions to continuous minimax functions. The technique is realized as a calculation system and allows effective estimating of digital VLSI radiation behavior without experimental investigation.
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kalashnikov2016bezopasnostnumerical
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| Authors | ;O. A. Kalashnikov |
| Journal | European journal of pharmacology |
| Year | 2016 |
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