cosima data analysis using multivariate techniques
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2015
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Abstract
We describe how to use multivariate analysis of complex TOF-SIMS (time-of-flight secondary ion mass spectrometry) spectra
by introducing the method of random projections. The technique allows us to do
full clustering and classification of the measured mass spectra. In this
paper we use the tool for classification purposes. The presentation describes
calibration experiments of 19 minerals on Ag and Au substrates using positive
mode ion spectra. The discrimination between individual minerals gives a
cross-validation Cohen κ for classification of typically about 80%.
We intend to use the method as a fast tool to deduce a qualitative similarity
of measurements.
| Reference Key |
siln2015geoscientificcosima
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|---|---|
| Authors | ;J. Silén;H. Cottin;M. Hilchenbach;J. Kissel;H. Lehto;S. Siljeström;K. Varmuza |
| Journal | radiologic technology |
| Year | 2015 |
| DOI |
10.5194/gi-4-45-2015
|
| URL | |
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