Measurement of residual stresses in Al2O3/Ni laminated composites using an X-ray diffraction technique
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ID: 113815
1995
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| Reference Key |
jr1995journalmeasurement
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| Authors | L. Hehn,C. Zheng,J. J. Mecholsky,C. R. Hubbard,J. J. Mecholsky Jr;L. Hehn;C. Zheng;J. J. Mecholsky;C. R. Hubbard;J. J. Mecholsky Jr; |
| Journal | journal of materials science |
| Year | 1995 |
| DOI |
10.1007/bf00356131
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| URL | |
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