Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement

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ID: 102835
2005
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Abstract
In white-light interference microscopy, measurement of surface shape generally requires peak extraction of the fringe function envelope. In this paper the Teager-Kaiser energy and higher-order energy operators are proposed for efficient extraction of the fringe envelope. These energy operators are compared in terms of precision, robustness to noise, and subsampling. Flexible energy operators, depending on order and lag parameters, can be obtained. Results show that smoothing and interpolation of envelope approximation using spline model performs better than Gaussian-based approach.
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boudraa2005teagerkaisereurasip Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Boudraa, Abdel-Ouahab ;Montaner, Denis ;Montgomery, Paul C.;Salzenstein, Fabien ;
Journal eurasip journal on advances in signal processing
Year 2005
DOI
DOI not found
URL
http://dx.doi.org/10.1155/ASP.2005.2804
Keywords
microscopy Engineering (General). Civil engineering (General) Technology Electrical engineering. Electronics. Nuclear engineering Descriptive and experimental mechanics optics. light telecommunication electronics applied optics. photonics

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