pinhole subwavelength aperture

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Advanced Surface Probing Using a Dual-Mode NSOM-AFM Silicon-Based Photosensor.

Karelits, Matityahu;Lozitsky, Emanuel;Chelly, Avraham;Zalevsky, Zeev;Karsenty, Avi;

2019 Nanomaterials DOI: E1792 218 views

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Nanomaterials

ISSN: 2079-4991 854 views

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silicon atomic force microscope (afm) dual-mode near-field scanning optical microscope (nsom) photodetector signal-to-noise ratio (snr)