oxide semiconductor

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Parasitic Current Induced by Gate Overlap in Thin-Film Transistors
Hyeon-Jun Lee;Katsumi Abe;June-Seo Kim;Won Seok Yun;Myoung-Jae Lee;Lee, Hyeon-Jun;Abe, Katsumi;Kim,...
2021 Materials (Basel, Switzerland) DOI: 10.3390/ma14092299 153 views

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