defect reaction

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Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors
Yingrui Li;Gangqiang Zha;Dengke Wei;Fan Yang;Jiangpeng Dong;Shouzhi Xi;Lingyan Xu;Wanqi Jie;Li, Ying...
2020 sensors DOI: 10.3390/s20072032 121 views

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cdznte deep-level defects photon counting performance polarization effect