Growth and characterization of MoS2/n-GaN and MoS2/p-GaN vertical heterostructure with wafer scale homogeneity

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ID: 78422
2020
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lee2020growthsolidstate Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Lee, J.
Journal solid-state electronics
Year 2020
DOI
10.1016/j.sse.2019.107751
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