Securing Cryptographic Chips against Scan-Based Attacks in Wireless Sensor Network Applications.
Clicks: 265
ID: 75705
2019
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This
article has not been analysed, so there is no overall score —
reader engagement is measured and shown alongside.
Reader Engagement
Steady Performance
30.0
/100
265 views
40 readers
AI Quality Assessment
Not analyzed
Readership in this journal
SteadyRanked #1,009 of 1,694 articles by views in sensors
Most read
Least read
Bar heights use a square-root scale. Only the 120 most-read articles are drawn; the journal has 1,694 in total.
Mint this article as an NFT
Not yet mintedCreate a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.
5
SUSD
one-off · no wallet required
Abstract
Wireless sensor networks (WSN) have deeply influenced the working and living styles of human beings. Information security and privacy for WSN is particularly crucial. Cryptographic algorithms are extensively exploited in WSN applications to ensure the security. They are usually implemented in specific chips to achieve high data throughout with less computational resources. Cryptographic hardware should be rigidly tested to guarantee the correctness of encryption operation. Scan design improves significantly the test quality of chips and thus is widely used in semiconductor industry. Nevertheless, scan design provides a backdoor for attackers to deduce the cipher key of a cryptographic core. To protect the security of the cryptographic system we first present a secure scan architecture, in which an automatic test control circuitry is inserted to isolate the cipher key in test mode and clear the sensitive information at mode switching. Then, the weaknesses of this architecture are analyzed and an enhanced scheme using concept of test authorization is proposed. If the correct authorization key is applied within the specific time, the normal test can be performed. Otherwise, only secure scan test can be performed. The enhanced scan scheme ensures the security of cryptographic chips while remaining the advantages of scan design.
| Reference Key |
wang2019securingsensors
Use this key to autocite in the manuscript while using
SciMatic Manuscript Manager or Thesis Manager
|
|---|---|
| Authors | Wang, WeiZheng;Deng, Zhuo;Wang, Jin;Sangaiah, Arun Kumar;Cai, Shuo;Almakhadmeh, Zafer;Tolba, Amr; |
| Journal | sensors |
| Year | 2019 |
| DOI |
E4598
|
| URL | |
| Keywords |
Citations
No citations found. To add a citation, contact the admin at info@scimatic.org
Comments
No comments yet. Be the first to comment on this article.