Atomic force microscopy - Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization: Principles, applications and perspectives

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2020
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shi2020atomicelectrochimica Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Shi, X.
Journal electrochimica acta
Year 2020
DOI
10.1016/j.electacta.2019.135472
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