High-Speed AFM Imaging of Nanopositioning Stages Using H∞ and Iterative Learning Control
Clicks: 137
ID: 74234
2020
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| Reference Key |
xie2020highspeedieee
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|---|---|
| Authors | Xie, H. |
| Journal | ieee transactions on industrial electronics |
| Year | 2020 |
| DOI |
10.1109/TIE.2019.2902792
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| URL | |
| Keywords | Keywords not found |
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