Whole-pattern fitting technique in serial femtosecond nanocrystallography
Clicks: 397
ID: 51014
2016
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This
article has not been analysed, so there is no overall score —
reader engagement is measured and shown alongside.
Reader Engagement
Steady Performance
79.7
/100
397 views
285 readers
Trending
AI Quality Assessment
Not analyzed
Readership in this journal
SteadyMint this article as an NFT
Not yet mintedCreate a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.
5
SUSD
one-off · no wallet required
Abstract
Serial femtosecond X-ray crystallography (SFX) has created new opportunities in the field of structural analysis of protein nanocrystals. The intensity and timescale characteristics of the X-ray free-electron laser sources used in SFX experiments necessitate the analysis of a large collection of individual crystals of variable shape and quality to ultimately solve a single, average crystal structure. Ensembles of crystals are commonly encountered in powder diffraction, but serial crystallography is different because each crystal is measured individually and can be oriented via indexing and merged into a three-dimensional data set, as is done for conventional crystallography data. In this way, serial femtosecond crystallography data lie in between conventional crystallography data and powder diffraction data, sharing features of both. The extremely small sizes of nanocrystals, as well as the possible imperfections of their crystallite structure, significantly affect the diffraction pattern and raise the question of how best to extract accurate structure-factor moduli from serial crystallography data. Here it is demonstrated that whole-pattern fitting techniques established for one-dimensional powder diffraction analysis can be feasibly extended to higher dimensions for the analysis of merged SFX diffraction data. It is shown that for very small crystals, whole-pattern fitting methods are more accurate than Monte Carlo integration methods that are currently used.
| Reference Key |
dilanian2016wholepatterniucrj
Use this key to autocite in the manuscript while using
SciMatic Manuscript Manager or Thesis Manager
|
|---|---|
| Authors | Dilanian, Ruben A.;Williams, Sophie R.;Martin, Andrew V.;Streltsov, Victor A.;Quiney, Harry M.; |
| Journal | iucrj |
| Year | 2016 |
| DOI |
DOI not found
|
| URL | |
| Keywords |
Citations
No citations found. To add a citation, contact the admin at info@scimatic.org
Cookies
We use strictly necessary cookies to run the site and keep you signed in. With your permission we would also use Google Analytics to see how the site is used, and Google AdSense to show ads on journal and article pages. Both stay off unless you accept, and you can change your mind at any time. How we use cookies · KVKK notice (Türkiye)
Cookie settings
Your session, form security (XSRF) and this choice; if you came through a member's referral link, its code for 30 days (referral_token). Journament's own cookies only.
Google Analytics 4 (Google LLC, USA): measures which pages are visited; the _ga and _ga_* cookies are kept for up to 2 years.
Google AdSense (Google LLC, USA): shows, measures and may personalise ads on journal, article and home pages; the __gads, __gpi and __eoi cookies are kept for up to 13 months.
Comments
No comments yet. Be the first to comment on this article.