A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions

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ID: 47096
2020
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mukherjee2020asolidstate Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Mukherjee, C.
Journal solid-state electronics
Year 2020
DOI
10.1016/j.sse.2019.107635
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