In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

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2019
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gupta2019inieee Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Gupta, G.
Journal ieee international conference on microelectronic test structures
Year 2019
DOI
10.1109/ICMTS.2019.8730920
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