Extending the Computable Depth Range in Electron Ptychography using Event-Converted Data

Clicks: 9
ID: 332341
2026
Free PDF
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This article has not been analysed, so there is no overall score — reader engagement is measured and shown alongside.
AI Quality Assessment
Not analyzed
Readership in this journal
Emerging

Ranked #28 of 30 articles by views in Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Most read Least read

Bar heights use a square-root scale.

Mint this article as an NFT
Not yet minted

Create a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.

5 SUSD one-off · no wallet required
Sign in to mint
Abstract
Iterative multislice electron ptychography enables depth sectioning but its range is constrained by the real-space patch imposed by detector sampling. Reconstruction using converted 4D-STEM patterns into electron-event lists decouples the model's reciprocal-space sampling interval from detector pixels size, reducing data volume, and enabling event-based loss function evaluation. The effect of patch size to the computable depth range, and the validity of the proposed method were demonstrated by simulation. The experimental demonstration on SSZ-13 zeolite shows improved reconstruction quality with preserved depth profiles; under 4× detector binning, reconstruction quality and depth sectioning are retained by selecting a finer reciprocal-space sampling interval, thereby extending the computable depth range without sacrificing angular coverage.
Reference Key
openalex_W7221780065 Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Kazutaka Mitsuishi, Masahiko Shimizu, Katsuaki Nakazawa, Masaki Takeguchi, Ayako Hashimoto, Toshiaki Tanigaki
Journal Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Year 2026
DOI
10.1093/jmicro/dfag035
URL
https://doi.org/10.1093/jmicro/dfag035
Keywords Keywords not found

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

Comments

No comments yet. Be the first to comment on this article.