Evaluation of a CeB6 Virtual Source Electron Gun Using a Custom-Made SEM to Enhance the Brightness and Resolution in Electron Microscopy

Clicks: 3
ID: 328035
2026
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This article has not been analysed, so there is no overall score — reader engagement is measured and shown alongside.
AI Quality Assessment
Not analyzed
Readership in this journal
Emerging

Ranked #24 of 26 articles by views in Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Most read Least read

Bar heights use a square-root scale.

Mint this article as an NFT
Not yet minted

Create a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.

5 SUSD one-off · no wallet required
Abstract
Abstract The electron source is a critical component determining electron microscope performance. Commercial electron microscopes typically employ Schottky emitters or cold field emitters that provide high brightness but require ultra-high vacuum operation. In contrast, the conventional crossover mode cerium hexaboride (CeB6) gun operates under a high vacuum, offering advantages in terms of vacuum requirements and cost. This study developed a virtual source mode CeB6 electron gun to enhance brightness and integrated it into a custom-made scanning electron microscope (SEM) with a single objective lens. Because the electron optical parameters of the SEM column were well defined, the two operating modes were analyzed by correlating simulation results with experimental measurements. The virtual source mode gun was measured a probe diameter of 23 nm (FW50) and reduced brightness of 1.2 × 105 A/m2 sr V, approaching the Langmuir limit, at an accelerating voltage of 2 kV. Compared to crossover mode operation in the fixed-magnification column, it produced a smaller probe diameter by more than 50 times and a higher brightness by more than tenfold. These results demonstrate that virtual source mode CeB6 operation offers high vacuum compatibility, superior brightness, and minimal probe size, with significant potential for advanced applications including bioimaging, semiconductor defect inspection, and next-generation electron beam systems.
Reference Key
openalex_W7211925688 Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Youngkwon Haam, Ha Rim Lee, Takashi Ogawa, Junhyeok Hwang, Jeong-Woong Lee, Hyunmo Gu, In‐Yong Park
Journal Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Year 2026
DOI
10.1093/mam/ozag093
URL
Keywords Keywords not found

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

No comments yet. Be the first to comment on this article.