Hermon MCP1 die configuration modification (spacer die2 elimination)

Clicks: 3
ID: 286683
2011
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This article has not been analysed, so there is no overall score — reader engagement is measured and shown alongside.
AI Quality Assessment
Not analyzed
Readership in this journal
Popular

Ranked #917 of 3,757 articles by views in Malay Journal

Most read Least read

Bar heights use a square-root scale. Only the 120 most-read articles are drawn; the journal has 3,757 in total.

Mint this article as an NFT
Not yet minted

Create a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.

5 SUSD one-off · no wallet required
Abstract
Intel Cavite has worked rigorously for Hermon Products to be Site Certified. It has created a team that focused all year long to address all issues encountered along the way. It has also generated solution paths that further improve the process. Hermon MCP1 Die Configuration Modification marks not only one of the most significant developments on this device but more importantly challenged the current design and promotes “out-of-the-box” thinking. Hermon is one of the most complex products that have ever qualified for production at Intel. Hermon process complexity comes from its logic and flash combination merged with a multi-chip package (MCP). This provides cellular customers with functionality that has not been explored before. This also enables the success of Hermon cellular processor to be qualified by Research In Motion (RIM) specifically on its wireless handheld device called Blackberry. Providing this sophisticated device its processing requirement as well as its future product development proves Intel’s goal to be manufacturers of next generation microprocessors. Hermon Site Certified configuration is designed to have a spacer die2 in between TYAX (die1) and SRAM (die2) which is the identified solution path to delamination caused by mold filler intrusion in between these two dies. An innovative solution was identified to replace the essential function of the spacer die in the current Hermon die-stacking configuration. The hard and challenging part is to make the system comparable to the objective of the current process. The solution is established through a long series of experiments, data gathering and analyses. Removing the spacer die significantly simplifies the current assembly process without compromising quality. Process simplification is the best path towards improved manufacturability. It also results to better traceability and maximize resources without acquiring any large cost. This project would also promote essential learning as next generation packages tend to have higher die staking level. Approach truly supports endeavor of the company to further “Leap Ahead” to find and drive novel solution to continue and to strengthen our Best in Class status.
Reference Key
persistent_1760659331_68f187836f091 Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Policar, Mark Ivan Barzaga
Journal Malay Journal
Year 2011
DOI
DOI not found
URL
Keywords Keywords not found

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

No comments yet. Be the first to comment on this article.