Maize yield under a changing climate: The hidden role of vapor pressure deficit
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2019
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Abstract
Temperatures over the next century are expected to rise to levels detrimental
to crop growth and yield. As the atmosphere warms without additional water
vapor input, vapor pressure deficit (VPD) increases as well. Increased
temperatures and accompanied elevated VPD levels can both lead to negative
impacts on crop yield. The independent importance of VPD, however, is often
neglected or conflated with that from temperature due to a tight correlation
between the two climate factors. We used a coupled process-based crop (MAIZSIM)
and soil (2DSOIL) model to gain a mechanistic understanding of the independent
roles temperature and VPD play in crop yield projections, as well as their
interactions with rising CO2 levels and changing precipitation patterns. We
found that by separating out the VPD effect from rising temperatures, VPD
increases had a greater negative impact on yield compared to that from warming.
The negative impact of these two factors varied with precipitation levels and
influenced yield through separate mechanisms. Warmer temperatures caused yield
loss mainly through shortening the growing season, while elevated VPD increased
water loss and triggered several water stress responses such as reduced
photosynthetic rates, lowered leaf area development, and shortened growing
season length. Elevated CO2 concentrations partially alleviated yield loss
under warming or increased VPD conditions through water savings, but the impact
level varied with precipitation levels and was most pronounced under drier
conditions. These results demonstrate the key role VPD plays in crop growth and
yield, displaying a magnitude of impact comparative to temperature and CO2. A
mechanistic understanding of the function of VPD and its relation with other
climate factors and management practices is critical to improving crop yield
projections under a changing climate.
| Reference Key |
kim2019maize
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|---|---|
| Authors | Jennifer Hsiao; Abigail L. S. Swann; Soo-Hyung Kim |
| Journal | arXiv |
| Year | 2019 |
| DOI |
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