Characterization of encapsulated graphene layers using extreme ultraviolet coherence tomography.

Clicks: 81
ID: 276119
2022
Article Quality & Performance Metrics
Overall Quality Improving Quality
0.0 /100
Combines engagement data with AI-assessed academic quality
AI Quality Assessment
Not analyzed
Abstract
Many applications of two-dimensional materials such as graphene require the encapsulation in bulk material. While a variety of methods exist for the structural and functional characterization of uncovered 2D materials, there is a need for methods that image encapsulated 2D materials as well as the surrounding matter. In this work, we use extreme ultraviolet coherence tomography to image graphene flakes buried beneath 200 nm of silicon. We show that we can identify mono-, bi-, and trilayers of graphene and quantify the thickness of the silicon bulk on top by measuring the depth-resolved reflectivity. Furthermore, we estimate the quality of the graphene interface by incorporating a model that includes the interface roughness. These results are verified by atomic force microscopy and prove that extreme ultraviolet coherence tomography is a suitable tool for imaging 2D materials embedded in bulk materials.
Reference Key
wiesner2022characterizationoptics Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Wiesner, Felix;Skruszewicz, Slawomir;Rödel, Christian;Abel, Johann Jakob;Reinhard, Julius;Wünsche, Martin;Nathanael, Jan;Grünewald, Marco;Hübner, Uwe;Paulus, Gerhard G;Fuchs, Silvio;
Journal Optics express
Year 2022
DOI
10.1364/OE.464378
URL
Keywords
quality of life football perceived benefits aggressiveness-related risks athlete engagement karate

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

Comments

No comments yet. Be the first to comment on this article.