Cross-Compiler Bipartite Vulnerability Search
Clicks: 209
ID: 274265
2021
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This
article has not been analysed, so there is no overall score —
reader engagement is measured and shown alongside.
Reader Engagement
Emerging Content
30.0
/100
209 views
51 readers
AI Quality Assessment
Not analyzed
Readership in this journal
EmergingRanked #62 of 113 articles by views in Electronics
Most read
Least read
Bar heights use a square-root scale.
Mint this article as an NFT
Not yet mintedCreate a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.
5
SUSD
one-off · no wallet required
Abstract
Open-source libraries are widely used in software development, and the functions from these libraries may contain security vulnerabilities that can provide gateways for attackers. This paper provides a function similarity technique to identify vulnerable functions in compiled programs and proposes a new technique called Cross-Compiler Bipartite Vulnerability Search (CCBVS). CCBVS uses a novel training process, and bipartite matching to filter SVM model false positives to improve the quality of similar function identification. This research uses debug symbols in programs compiled from open-source software products to generate the ground truth. This automatic extraction of ground truth allows experimentation with a wide range of programs. The results presented in the paper show that an SVM model trained on a wide variety of programs compiled for Windows and Linux, x86 and Intel 64 architectures can be used to predict function similarity and that the use of bipartite matching substantially improves the function similarity matching performance.
| Reference Key |
black2021electronicscross-compiler
Use this key to autocite in the manuscript while using
SciMatic Manuscript Manager or Thesis Manager
|
|---|---|
| Authors | Paul Black;Iqbal Gondal;Black, Paul;Gondal, Iqbal; |
| Journal | Electronics |
| Year | 2021 |
| DOI |
10.3390/electronics10111356
|
| URL | |
| Keywords |
Citations
No citations found. To add a citation, contact the admin at info@scimatic.org
Comments
No comments yet. Be the first to comment on this article.