Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K-Auger and K-conversion Spectra Emitted from Thin Films
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ID: 271976
2002
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| Reference Key |
ryšavý2002journaldetermination
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|---|---|
| Authors | L. Kövér,S. Tougaard,J. Tóth,D. Varga,O. Dragoun,A. Kovalík,M. Ryšavý;L. Kövér;S. Tougaard;J. Tóth;D. Varga;O. Dragoun;A. Kovalík;M. Ryšavý; |
| Journal | Journal of Surface Analysis |
| Year | 2002 |
| DOI |
10.1384/jsa.9.281
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| URL | |
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