XDS

Clicks: 48
ID: 271338
2010
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Abstract
The usage and control of recent modifications of the program package XDS for the processing of rotation images are described in the context of previous versions. New features include automatic determination of spot size and reflecting range and recognition and assignment of crystal symmetry. Moreover, the limitations of earlier package versions on the number of correction/scaling factors and the representation of pixel contents have been removed. Large program parts have been restructured for parallel processing so that the quality and completeness of collected data can be assessed soon after measurement.
Reference Key
w.2010https://journals.iucr.org/xds Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Kabsch, W.;;Kabsch, W.;;IUCr;
Journal https://journals.iucr.org/
Year 2010
DOI
doi:10.1107/S0907444909047337
URL
https://doi.org/10.1107%2FS0907444909047337
Keywords
xds

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