Combined application of ICES and XPS methods for quantitative electron spectroscopy of Tc compounds

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ID: 269855
1990
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Authors L. Kövér,I. Cserny,M. Fišer,V. Brabec,O. Dragoun,J. Novák;L. Kövér;I. Cserny;M. Fišer;V. Brabec;O. Dragoun;J. Novák;
Journal surface and interface analysis
Year 1990
DOI
10.1002/sia.740160144
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