Combined application of ICES and XPS methods for quantitative electron spectroscopy of Tc compounds
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ID: 269855
1990
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| Reference Key |
novák1990surfacecombined
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| Authors | L. Kövér,I. Cserny,M. Fišer,V. Brabec,O. Dragoun,J. Novák;L. Kövér;I. Cserny;M. Fišer;V. Brabec;O. Dragoun;J. Novák; |
| Journal | surface and interface analysis |
| Year | 1990 |
| DOI |
10.1002/sia.740160144
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