Simulations and Design of a Single-Photon CMOS Imaging Pixel Using Multiple Non-Destructive Signal Sampling
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ID: 267987
2020
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Abstract
A single-photon CMOS image sensor (CIS) design based on pinned photodiode (PPD) with multiple charge transfers and sampling is described. In the proposed pixel architecture, the photogenerated signal is sampled non-destructively multiple times and the results are averaged. Each signal measurement is …
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| Reference Key |
kd2020sensorssimulations
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| Authors | Stefanov KD;Prest MJ;Downing M;George E;Bezawada N;Holland AD;; |
| Journal | sensors |
| Year | 2020 |
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