Novel TEM Microscopy and Electron Diffraction Techniques to Characterize Cultural Heritage Materials: From Ancient Greek Artefacts to Maya Mural Paintings.

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ID: 2612
2019
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Abstract
To understand in-depth material properties, manufacturing, and conservation in cultural heritage artefacts, there is a strong need for advanced characterization tools that enable analysis down to the nanometric scale. Transmission electron microscopy (TEM) and electron diffraction (ED) techniques, like 3D precession electron diffraction tomography and ASTAR phase/orientation mapping, are proposed to study cultural heritage materials at nanoscale. In this work, we show how electron crystallography in TEM helps to determine precise structural information and phase/orientation distribution of various pigments in cultural heritage materials from various historical periods like Greek amphorisks, Roman glass tesserae, and pre-Hispanic Maya mural paintings. Such TEM-based methods can be an alternative to synchrotron techniques and can allow distinguishing accurately different crystalline phases even in cases of identical or very close chemical compositions at the nanometric scale.
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nicolopoulos2019novelscanning Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Nicolopoulos, Stavros;Das, Partha P;Pérez, Alejandro Gómez;Zacharias, Nikolaos;Cuapa, Samuel Tehuacanero;Alatorre, Jesús Angel Arenas;Mugnaioli, Enrico;Gemmi, Mauro;Rauch, Edgar F;
Journal scanning
Year 2019
DOI
10.1155/2019/4870695
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