defect detection on texture using statistical approach

Clicks: 195
ID: 259444
2015
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Abstract
In this paper we present several techniques for detecting simple defect on the texture. The simple defect means, that the defect can be detected via image histogram or via wavelet of the image histogram. Hill estimator is one of the techniques that we suggest to use to solve this problem, since it does not need estimate parameters for estimating the image density
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halim2015jurnaldefect Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors ;Siana Halim
Journal coatings
Year 2015
DOI
DOI not found
URL
http://puslit2.petra.ac.id/ejournal/index.php/ind/article/view/19344
Keywords
wavelet texture kernel density estimate industrial engineering defect management engineering image histogram

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