theoretical study on synchronous characterization of surface and interfacial mechanical properties of thin-film/substrate systems with residual stress based on pressure blister test technique
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ID: 239840
2018
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Abstract
In this study, based on the pressure blister test technique, a theoretical study on the synchronous characterization of surface and interfacial mechanical properties of thin-film/substrate systems with residual stress was presented, where the problem of axisymmetric deformation of a blistering film with initial stress was analytically solved and its closed-form solution was presented. The expressions to determine Poisson’s ratios, Young’s modulus, and residual stress of surface thin films were derived; the work done by the applied external load and the elastic energy stored in the blistering thin film were analyzed in detail and their expressions were derived; and the interfacial adhesion energy released per unit delamination area of thin-film/substrate (i.e., energy release rate) was finally presented. The synchronous characterization technique presented here has theoretically made a big step forward, due to the consideration for the residual stress in surface thin films.
| Reference Key |
yang2018polymerstheoretical
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|---|---|
| Authors | ;Zhi-xin Yang;Jun-yi Sun;Ke Li;Yong-sheng Lian;Xiao-ting He;Zhou-lian Zheng |
| Journal | Journal of Fluorescence |
| Year | 2018 |
| DOI |
10.3390/polym10010049
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| URL | |
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