low-cost replication of self-organized sub-micron structures into polymer films

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ID: 217582
2015
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Abstract
In this paper, the results of exploiting self-organized sub-micron polystyrene (PS) wrinkle patterns possessing random orientation, in preparation of a nickel stamp for hot embossing purposes, are presented. Self-organized patterns were prepared employing a method in which a stiff cross-linked capping layer on the topmost part of the soft polystyrene layer was created by using reactive ion etching (RIE) device with mild conditions and argon as a process gas, and the wrinkle formation was initiated thermally. Different surface patternings were obtained using silicon and stainless steel (SST) wafers as substrates. Prepared Ni-stamps were employed in hot embossing of polycarbonate (PC) and cyclo-olefin polymer (COP) films, using a nano-imprinting process. The replication quality of the self-organized wrinkle structures in PC and COP films was monitored by comparing the shape and dimensions of the original and final surface structures. The hot embossed sub-micron scale features, originally formed on stainless steel substrate, were found to have influence on the optical properties of the PC and COP films by lowering their reflectances.
Reference Key
stenberg2015expresslow-cost Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors ;H. Stenberg;P. Stenberg;L. Takkunen;M. Kuittinen;M. Suvanto;T. T. Pakkanen
Journal introducing the mysql 8 document store
Year 2015
DOI
10.3144/expresspolymlett.2015.11
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