microscopia de varredura por força: uma ferramenta poderosa no estudo de polímeros scanning force microscopy: a powerful tool on the study of polymers
Clicks: 222
ID: 204530
1997
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This
article has not been analysed, so there is no overall score —
reader engagement is measured and shown alongside.
Reader Engagement
Steady Performance
30.0
/100
222 views
24 readers
AI Quality Assessment
Not analyzed
Readership in this journal
SteadyRanked #35 of 78 articles by views in journal of the chemical society, perkin transactions 1
Most read
Least read
Bar heights use a square-root scale.
Mint this article as an NFT
Not yet mintedCreate a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.
5
SUSD
one-off · no wallet required
Abstract
As técnicas de microscopia de varredura por força tem promovido um grande impacto em ciência dos materiais devido a possibilidade de obtenção de imagens em escala que pode chegar no nível atômico. Neste trabalho serão apresentados o princípio básico de funcionamento da microscopia de varredura por força, os vários modos de operação e as forças envolvidas e medidas. O potencial de aplicação destas técnicas no estudo de materiais, e em particular de polímeros, serão discutidos. Uma comparação da microscopia de força atômica com outras técnicas de microscopia será apresentada, assim como exemplos da utilização da técnica de microscopia de força atômica para o estudo de polímeros.
The scanning force microscopy techniques are promoting a great impact on materials science due to the possibility to obtain images down to the atomic scale. This work reports on the basic principles of the scanning force microscopes, their operation modes and the forces involved and measured. The potential application of these techniques on the study of materials, particularly on polymers, is discussed. A comparison of atomic force microscopy - AFM - with other techniques is presented, as well as some examples of the use of AFM on the study of polymers.
The scanning force microscopy techniques are promoting a great impact on materials science due to the possibility to obtain images down to the atomic scale. This work reports on the basic principles of the scanning force microscopes, their operation modes and the forces involved and measured. The potential application of these techniques on the study of materials, particularly on polymers, is discussed. A comparison of atomic force microscopy - AFM - with other techniques is presented, as well as some examples of the use of AFM on the study of polymers.
| Reference Key |
herrmann1997polmerosmicroscopia
Use this key to autocite in the manuscript while using
SciMatic Manuscript Manager or Thesis Manager
|
|---|---|
| Authors | ;Paulo S. P Herrmann;Marcelo A. P. da Silva;Rubens Bernardes Fº;Aldo E Job;Luiz A Colnago;Jane E Frommer;Luiz H.C Mattoso |
| Journal | journal of the chemical society, perkin transactions 1 |
| Year | 1997 |
| DOI |
10.1590/S0104-14281997000400009
|
| URL | |
| Keywords |
Citations
No citations found. To add a citation, contact the admin at info@scimatic.org
Comments
No comments yet. Be the first to comment on this article.