atomic force microscopy visualization of hard segment alignment in stretched polyurethane nanofibers prepared by electrospinning
Clicks: 304
ID: 203531
2014
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This
article has not been analysed, so there is no overall score —
reader engagement is measured and shown alongside.
Reader Engagement
Steady Performance
30.0
/100
304 views
63 readers
AI Quality Assessment
Not analyzed
Readership in this journal
SteadyRanked #6 of 67 articles by views in ieee control systems letters
Most read
Least read
Bar heights use a square-root scale.
Mint this article as an NFT
Not yet mintedCreate a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.
5
SUSD
one-off · no wallet required
Abstract
Molecular-level orientation within nanofibers has been attracting attention as a tool for controlling and designing highly functional nanofibers. In this study, we used atomic force microscopy to visualize the phase separation between soft and hard segments on a polyurethane (PU) nanofiber surface prepared by electrospinning. Furthermore, the stretched nanofibers prepared with a high-speed rotating collector were found to have a different phase distribution in the phase-separated structure, with the hard segment domains aligned to the fiber axis. In contrast, unstretched PU nanofibers prepared without rotation were observed to have nonuniformly distributed segments. These results indicate that the application of an intense elongation force along the nanofiber axis with a rotating mandrel collector changed the distribution of segment alignments.
| Reference Key |
sakamoto2014scienceatomic
Use this key to autocite in the manuscript while using
SciMatic Manuscript Manager or Thesis Manager
|
|---|---|
| Authors | ;Hiroaki Sakamoto;Hitoshi Asakawa;Takeshi Fukuma;Satoshi Fujita;Shin-ichiro Suye |
| Journal | ieee control systems letters |
| Year | 2014 |
| DOI |
10.1088/1468-6996/15/1/015008
|
| URL | |
| Keywords |
Citations
No citations found. To add a citation, contact the admin at info@scimatic.org
Comments
No comments yet. Be the first to comment on this article.