Magnetotransport Mechanism of Individual Nanostructures Direct Magnetoresistance Measurement SEM.

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ID: 198032
2020
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Abstract
The accurate magnetoresistance (MR) measurement of individual nanostructures is essential and important for either the enrichment of fundamental knowledge of the magnetotransport mechanism or the facilitation of desired design of magnetic nanostructures for various technological applications. Herein, we report a deep investigation on the magnetotransport mechanism of a single CoCu/Cu multilayered nanowire direct MR measurement using our invented magnetotransport instrument scanning electron microscope. Off-axis electron holography experiments united with micromagnetic simulation prove that the CoCu layers in CoCu/Cu multilayered nanowires form a single-domain structure, in which the alignment of magnetic moments is mainly determined by shape anisotropy. The MR of the single CoCu/Cu multilayered nanowire is measured to be only 1.14% when the varied external field is applied along the nanowire length axis, which matches with the theoretical prediction of the granular film model. Density functional theory calculations further disclose that spin-dependent scattering at the interface between magnetic and nonmagnetic layers is responsible for the intrinsic magnetotransport mechanism.
Reference Key
zhang2020magnetotransportacs Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Junwei Zhang, Yong Peng, Hongbin Ma, Senfu Zhang, Yang Hu, Xue Zeng, Xia Deng, Chaoshuai Guan, Rongrong Chen, Yue Hu, Abdul Karim, Kun Tao, Mingjie Zhang, Xixiang Zhang
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Journal ACS applied materials & interfaces
Year 2020
DOI
10.1021/acsami.0c09773
URL
Keywords
in situ scanning electron microscopy individual nanostructures magnetotransport instrument magnetotransport mechanism off-axis electron holography

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