modelling of atomic imaging and evaporation in the field ion microscope

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ID: 197548
2012
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Abstract
Imaging and evaporation of atoms in the field ion microscope (FIM) has been modelled by using finite difference methods to calculate the voltage distribution around a tip and hence the electric field strength experienced by individual atoms. Atoms are evaporated based on field strength using a number of different mathematical models which yield broadly similar results. The tip shapes and simulated FIM images produced show strong agreement with experimental results for tips of the same orientation and crystal structure. Calculations have also been made to estimate the effects on resolution of using a field-sharpened tip for scanning probe microscopy.
Reference Key
fraser2012journalmodelling Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors ;Keith J. Fraser;John J. Boland
Journal BMC infectious diseases
Year 2012
DOI
10.1155/2012/961239
URL
http://dx.doi.org/10.1155/2012/961239
Keywords
Technology (General)

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