study of the ground-state geometry of silicon clusters using artificial neural networks

Clicks: 113
ID: 187589
2002
Free PDF
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This article has not been analysed, so there is no overall score — reader engagement is measured and shown alongside.
AI Quality Assessment
Not analyzed
Readership in this journal
Popular

Ranked #89 of 96 articles by views in Majalah Ilmiah Teknologi Elektro

Most read Least read

Bar heights use a square-root scale.

Mint this article as an NFT
Not yet minted

Create a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.

5 SUSD one-off · no wallet required
Sign in to mint
Abstract
Theoretical determination of the ground-state geometry of Si clusters is a difficult task. As the number of local minima grows exponentially with the number of atoms, to find the global minimum is a real challenge. One may start the search procedure from a random distribution of atoms but it is probably wiser to make use of any available information to restrict the search space. Here, we introduce a new approach, the Assisted Genetic Optimization (AGO) that couples an Artificial Neural Network (ANN) to a Genetic Algorithm (GA). Using available information on small Silicon clusters, we trained an ANN to predict good starting points (initial population) for the GA. AGO is applied to Si10 and Si20 and compared to pure GA. Our results indicate: i) AGO is, at least, 5 times faster than pure GA in our test case; ii) ANN training can be made very fast and successfully plays the role of an experienced investigator; iii) AGO can easily be adapted to other optimization problems.
Reference Key
lemes2002materialsstudy Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors ;M.R. Lemes;L.R. Marim;A. Dal Pino Jr.
Journal Majalah Ilmiah Teknologi Elektro
Year 2002
DOI
10.1590/S1516-14392002000300011
URL
http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392002000300011
Keywords
mechanics of materials

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

Comments

No comments yet. Be the first to comment on this article.