empirical regression models for estimating multiyear leaf area index of rice from several vegetation indices at the field scale
Clicks: 191
ID: 159722
2014
Article Quality & Performance Metrics
Overall Quality
Improving Quality
0.0
/100
Combines engagement data with AI-assessed academic quality
Reader Engagement
Popular Article
30.0
/100
190 views
27 readers
Trending
AI Quality Assessment
Not analyzed
Abstract
Leaf area index (LAI) is among the most important variables for monitoring crop growth and estimating grain yield. Previous reports have shown that LAI derived from remote sensing data can be effectively applied in crop growth simulation models for improving the accuracy of grain yield estimation. Therefore, precise estimation of LAI from remote sensing data is expected to be useful for global monitoring of crop growth. In this study, as a preliminary step toward application at the regional and global scale, the suitability of several vegetation indices for estimating multi-year LAI were validated against field survey data. In particular, the performance of a vegetation index known as time-series index of plant structure (TIPS), which was developed by the authors, was evaluated by comparison with other well-known vegetation indices. The estimated equation derived from the relationship between TIPS and LAI was more accurate at estimating LAI than were equations derived from other vegetation indices. Although further research is required to demonstrate the effectiveness of TIPS, this study indicates that TIPS has the potential to provide accurate estimates for multi-year LAI at the field scale.
| Reference Key |
maki2014remoteempirical
Use this key to autocite in the manuscript while using
SciMatic Manuscript Manager or Thesis Manager
|
|---|---|
| Authors | ;Masayasu Maki;Koki Homma |
| Journal | Journal of pharmacological sciences |
| Year | 2014 |
| DOI |
10.3390/rs6064764
|
| URL | |
| Keywords |
Citations
No citations found. To add a citation, contact the admin at info@scimatic.org
Comments
No comments yet. Be the first to comment on this article.