burn - in test detection method for electronic products based on vfsa – elm
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2018
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| Reference Key |
lee2018journalburn
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| Authors | ;Yanming Lee;Hong - yi Zhang;Jiangshui Hong;Weiqi Lee;Jimmi Rosa |
| Journal | communications in statistics: simulation and computation |
| Year | 2018 |
| DOI |
10.25103/jestr.114.05
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