time domain characterization of light trapping states in thin film solar cells
Clicks: 113
ID: 150405
2013
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Abstract
Spectral interferometry of the backscattered radiation reveals coherence lifetimes of about 150 fs for nanolocalized electromagnetic modes in textured layered nanostructures as they are commonly used in thin film photovoltaics to achieve high cell efficiencies.
| Reference Key |
w.2013epjtime
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|---|---|
| Authors | ;Pfeiffer W.;Lükermann F.;Differt D.;Birlo M.;Stiebig H. |
| Journal | utilitas mathematica |
| Year | 2013 |
| DOI |
10.1051/epjconf/20134108016
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